Tuesday, July 13, 2010

RELEX Free Webcast: Challenges and Opportunities of Measuring Properties of Nanoparticles by Dr. Donald R. Baer from Pacific Northwest National Laboratory

RELEX Free Webcast: Challenges and Opportunities of Measuring Properties of Nanoparticles by Dr. Donald R. Baer from Pacific Northwest National Laboratory

"Challenges and Opportunities of Measuring Properties of Nanoparticles and Nanostructured Materials and the Need for Multi-Technique Approaches", a free webcast by Dr. Donald R. Baer, Laboratory Fellow Pacific Northwest National Laboratory - is now available on-demand

(PRWEB) September 7, 2005

New York, NY, September 7, 2005 -- The free webcast "Challenges and Opportunities of Measuring Properties of Nanoparticles and Nanostructured Materials and the Need for Multi-Technique Approaches", by Dr. Donald R. Baer, Laboratory Fellow Pacific Northwest National Laboratory - is now available on-demand.

This webcast was first broadcasted live at the Research Lab Expo (RELEX), an online conference and virtual exhibition launched by the Reed Business Information Science.

To register for this free webcast, visit: http://relex. unisfair. com/registration. jsp? code=1224 (http://relex. unisfair. com/registration. jsp? code=1224)

Webcast Summary:

Nanostructured materials of various types and forms are increasingly subject to nearly every type of chemical and physical analysis possible. Because of their small size, highly spatially resolved methods are of great value.

Since nanostructured material systems often contain a large amount of surface or interface area, it is also natural to characterize them using tools designed to analyze surfaces and interfaces. We have found that nanoparticles and other nanostructured materials present a variety of obstacles to useful analysis.

Issues related to specimen handling, contamination, environmental conditions, and time can be important for analysis of many materials but are of greater concern for nanomaterials. Issues related to the shape and stability of nanostructured materials are less discussed but play a major role in some of our studies. Adequate analysis often requires application of several complementary analysis methods and reconciliation of the different types of information they provide.

To register for this free webcast, visit: http://relex. unisfair. com/registration. jsp? code=1224 (http://relex. unisfair. com/registration. jsp? code=1224)

About Dr. Donald R. Baer:

Donald Baer is a Laboratory Fellow in the Fundamental Science Directorate of Pacific Northwest National Laboratory (PNNL). Since joining PNNL in 1976, he has specialized in the use of surface sensitive techniques to study surface and interphase reactions and material surface chemistry.

In addition to his research activities he serves as a Co-Director of the Joint Institute for Nanoscience between the Univ. of Washington and PNNL, as Deputy Manager of the PNNL's Nanoscience and Nanotechnology Initiative, and PNNL coordinator for a series of courses in nanoscience and nanotechnology.

He is an Adjunct Professor of Physics at Washington State Univ., an Adjunct Professor of Chemistry at the Univ. of Washington, and serves as chair of ASTM Committee E42 on Surface Analysis. He has been associated with the Environmental Molecular Sciences Laboratory, a DOE User Facility at PNNL since its inception.

Dr. Baer holds a BS degree in Physics from Carnegie Mellon Univ. and a PhD in Physics from Cornell Univ. He is the principle investigator of DOE nanoscience program “The Reaction Specificity of Nano Particles in Solution.”

To register for this free webcast, visit: http://relex. unisfair. com/registration. jsp? code=1224 (http://relex. unisfair. com/registration. jsp? code=1224)

About RELEX:

The Research Lab Expo (RELEX) is an online conference and virtual exhibition launched by the Reed Business Information Science Group. The online event features a high quality educational forum comprised of multiple live free webcasts.

The Research Lab Expo offers cutting-edge compelling web content to industry professionals and decision makers across multiple industries, including aerospace and defense, automotive, chemicals, petroleum, coatings, inks, adhesives, textiles, computers, software, office equipment, energy, utilities, environmental, food, beverage, tobacco, government lab, industrial equipment, instruments, laboratory, design, manufacturing, metal, materials, pharmaceuticals, biopharmaceuticals, healthcare, plastic, rubber, paper, pulp wood, scientific, medical, test instruments, semiconductors, electronic components, and telecom.

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