Nanovea's 3D Non-Contact Profilers Break New Ground
Nanovea announced today that it's Profiler line-up will now include a system with measurement speeds over 180 times faster. With this new advancement Nanovea's Profiler will now have the capability to reach speeds suitable for more time constraint production and quality control environments. This new advancement in Profiler Technology is a breakthrough for use within these particular environments.
Irvine, CA (PRWEB) November 23, 2008
Prior to this new advancement this profiling technique had required a point-by-point measurement, which acquired single data points while the sample being measured moved back-and-forth under the optics to create 3D mapping. With this new technology there will be line of 180 measureable points that will be acquired simultaneously, which will significantly decrease the time to create a 3D mapping of the surface. "I'm excited about this new capability; this will give us the ability to work with new markets that require high throughputs." Said Craig Leising, Product Manager, Nanovea.
The new Profiler System uses 1 x 180 array of measurement points and can scan up to 1800 lines per second to create and overall scan rate of up to 324,000 points per second. The system will be capable of measuring large areas in seconds with high resolution and can be equipped with image recognition software for high speed inspection. Options will also include a scanning mirror to create a field scanning function that will measure 180 points by 230 lines. Custom inline system will also be available.
Nanovea is the result of 16 years that Micro Photonics Inc. has provided professional solutions and experienced service throughout the tribology, nano-indentation, adhesion/scratch testing, profilometry, micro-tomography, imaging and other related fields of materials and thin films research and development industries. After years of client feedback and the dedication to providing superior instrumental solutions Nanovea was launched in 2004 at the Micro Photonics Inc. office in Irvine CA. Since 2004 Nanovea has manufactured testing Instruments for Instrumented Indentationin, Scratch/Adhesion, Wear/Friction and Non-Contact 3D Profilometry. Nanovea's instruments can be found in distinguished educational and industrial organizations ranging from automotive to cosmetic, biotechnology to medical devices, microelectronics to space applications. Thousands of clients rely on Nanovea for innovative solutions, technically superior products, confident application assistance and comprehensive laboratory contract service. Our goal is to provide superior instruments, unmatched consultation service and meticulous contract laboratory results.
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